Combining Rietveld and reflectivity for thin film analysis
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چکیده
منابع مشابه
Angle-Resolved Reflectivity Analysis of Textured Substrates for Liquid-Phase Crystallized Silicon Thin-Film Solar Cells
Angular dependency of the reflectivity of two distinct nano-textured and planar reference liquid-phase crystallized silicon solar cells are investigated. We show that nano-textured layers outperform planar devices for all incident angles. OCIS codes: 040.5350, 310.6845
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 2002
ISSN: 0108-7673
DOI: 10.1107/s0108767302091808